Digital Noise Monitoring of Defect Origin
Autor:
Springer Nature EN
Verlag:
Springer Nature EN
Sprache:
English
From the reviews:“The monograph builds on a long series of publications by the author over the last decade. … monograph should benefit researchers and practicing engineers … particularly those in search of new application tools in quality engineering applied in a broad setting. … In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry.” (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)
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ISBN
978-0-387-71753-1
EAN
9780387717531
Erscheinungsjahr
7/25/2007
Verlag
Springer Nature EN
Author
Aliev, Telman
Sprache
English
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