Power-Constrained Testing of VLSI Circuits
A Guide to the IEEE 1149.4 Test Standard
Autor:
Springer Us;Springer New York
Verlag:
Springer Us;Springer New York
Sprache:
English
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Untertitel
A Guide to the IEEE 1149.4 Test Standard
ISBN
978-1-402-07235-2
EAN
9781402072352
Erscheinungsjahr
2/28/2003
Edition
2003
Verlag
Springer Us;Springer New York
Author
Al-Hashimi, Bashir M.;Nicolici, Nicola
Sprache
English
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