Interfacial Compatibility in Microelectronics
Moving Away from the Trial and Error Approach
Autor:
Springer London
Verlag:
Springer London
Sprache:
English
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Untertitel
Moving Away from the Trial and Error Approach
ISBN
978-1-447-12470-2
EAN
9781447124702
Erscheinungsjahr
1/10/2012
Verlag
Springer London
Author
Laurila, Tomi;Vuorinen, Vesa;Paulasto-Kröckel, Mervi;Turunen, Markus;Mattila, Toni T.
Sprache
English
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